Second TermJSS 3Digital Technology
Second Term lessons
This term returns to graphical tools and one-dimensional arrays in BASIC, reviews high-level languages and data representation, builds on security and ethics topics, runs intensive revision and mock examinations, then targets final SSCE preparation. Requirements are senior secondary: precise technical vocabulary, worked diagrams, inspectable programs and a focused revision strategy.
- Weeks
- 9 weeks
- Curriculum outlines
- 9 curriculum outlines
Weekly lessons
Open a week to read the notes, the teacher plan and the curriculum outline.
W01Revision of First-Term WorkLesson objectives By the end of the week, learners should be able to: Recall the full First Term across all three terms without notes.W02Graphics: CorelDRAW PracticalLesson objectives By the end of the week, learners should be able to: Open CorelDRAW and name its main drawing tools.W03BASIC One-Dimensional Arrays: ConceptsLesson objectives By the end of the week, learners should be able to: Define a one-dimensional array and state its indexing rule.W04BASIC One-Dimensional Arrays: PracticalLesson objectives By the end of the week, learners should be able to: Write a program using an array to compute totals and averages.W05High-Level Languages: ReviewLesson objectives By the end of the week, learners should be able to: Recall five high-level language families introduced this term.W06Data Representation and Number Bases: ReviewLesson objectives By the end of the week, learners should be able to: Recall conversions between decimal, binary, octal and hexadecimal.W07Security and EthicsLesson objectives By the end of the week, learners should be able to: Recall five common cyber threats and their protections from earlier terms.W08Intensive Revision and Mock PreparationLesson objectives By the end of the week, learners should be able to: Test objective knowledge with a short mock quiz.W09Mock ExaminationLesson objectives By the end of the mock examination week, learners should be able to: Demonstrate recall under examination conditions.